testable blocks. ○ Constant-testability designs (C-testable designs). Soma 6 issues in testing and probe card design. CPU. RAM . IDDQ design guidelines. One DFT solution for systems on chip, based on IDDQ measuring concept is presented in this paper. The application of Reconfigurable neurai networks off chi . IDDQ Test With the IDDQ test method one determines the power consumption of a chip at a stable state (quiescent current). Then a chip is.

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Heat sinks, Part 2: CMOS Technology desigb 1. Of course faults can also cause an increased current during the phase transient states. This generally occur in circuit as above where redundant logic is present.

Therefore if the chip itself is monitoring the system clock this must be deactivated for the test. Since the model of stu c k at faults does not deter- mine a unique kind of physical defect, some stu c k a t faults might increase quiescent current, whilest others do not. Equating complex number interms of the other 6. It may also be used to improve the r eliabilit y of chips section PV charger battery circuit 4.

Then one has to compare dwsign costs of both kinds of erroneous decisions: Part and Inventory Search. ModelSim – How to force a struct type written in SystemVerilog? Here we will conclude that their is no pattern which can detect both the fault at a time. On the other hand, such simulations can also be used to determine the accuracy needed for an IDDQ measurement. In which case i compulsory need to use Iddq testing and not stuck-at fault test.?


Applying the same test pattern to several correct chips one obtains different measured current values. Therefore the circuit may not use oscillators, and whenever there are dynamic storage blocks they have to be separated for the test. Thus an IDDQ test needs fewer test patterns. Now,Just want to know practically how we measure Iddq current? What is the function of Fir in this circuit 3.

Design for Testability:IDDQ Test | pcb design

What are the expected costs if a defect chip remains undetected and what does is cost to classify a correct chip as faulty? Dec 248: I hope you got it. For an automatic IDDQ test pattern generation with common test pattern generators it is very easy teatability model the bridgin g fault.

It is also possible that despite the fault the voltage at the output y may be interpreted as the correct logic value.

The threshold value for an IDDQ measurement should be determined according to the expected erroneous current.

Here the n-transistor is well suited to transmit the value 0 and the p- transistor is well suited to transmit 1. Since for computing IDDQ test patterns fault propagation can be omitted, there are more possible test patterns for a fault than for functional tests. Testabiity of the necessary time for exact current measurement the circuit must be able to work at a slow clock rate. Posted on October 8, by ahmed farahat Leave a comment. An increased current can even be caused by a transistor stu c k open fault.

Your email address will not be published. With this technique self-tests are also possible. Within the model of IDDQ faults all conceivable faults are considered which may increase power consumption.


Design for testability for SoC based on IDDQ scanning

I am not getting the picture. In particular, it is suitable for chips with low power supply. Desiyn should be some rules. Distorted Sine output from Transformer 8. I mean from top module itself?

And while applying test pattern for any one fault will give the expected output and not the faulty output. So the consider fault is undetectable. This effect is called fault masking, where one fault in the circuit will mask the other fault. But since such a resistor within a supply line will reduce the applied voltage it has to be shorted by a transistor for normal operation of the chip. I mean we need to observe a single pin for Iddq from top? For example, the fault model includes bridgin g faultsgat e ox- id e shortstransisto r stuck on faultsand some stuc k at faults.

Please give me any example. In order to receive meaningful results IDDQ tests should be restricted to such test patterns producing a low power consumption for correct chips. Further faults that cause an increase of quiescent current are bridgin g faultsand gat e oxide shorts. In order to apply an IDDQ test the circuit has to satisfy special properties.

For testing, the transistor is opened and the capacitor is loaded by the quiescent current. The Concept of Electronic Design Automation:

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