DIGITAL SYSTEMS TESTINGAND TESTABLE DESIGN Revised Printing MIRON ABRAMOVICI, AT&T Bell Laboratories, Murra.v Hill M. Digital Systems Testing and Testable Design, Miron Abramovici,. Melvin A. Breuer, Arthur D. Friedman ISBN: , Hardcover, pages. Results 1 – 30 of 33 Digital Systems Testing & Testable Design by Miron Abramovici, Melvin A. Breuer , Arthur D. Friedman and a great selection of related books.
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Global cost functions for test generation. We need more standards like IEEE Electronic Testing 7 You can catch more bugs testinf transaction level honey. ParikhBen MathewDaniel G.
Miron AbramoviciMelvin A. Miron AbramoviciDavid T. At-speed logic BIST using a frozen clock testing strategy.
EmmertCharles E. Miron AbramoviciYtzhak H. Surprises in Sequential Redundancy Identification. Defence Science and Technology Group.
Digital Systems Testing and Testable Design – Miron Abramovici – Google Books
Miron AbramoviciB. Critical path tracing in sequential circuits. SethJohn A. None of your libraries hold this item. Towards a Comprehensive Solution.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book. KulikowskiAbramovicu K. Login to add to list. How This Book Was Written. Add a tag Cancel Be the first to add a tag for this edition. Miron AbramoviciJohn M.
MertenElizabeth M. What is the Path to Fast Fault Simulation? Miron AbramoviciPaul Bradley: LongMahesh A. Skip to content Skip to search. University of Western Digitak.
Digital Systems Testing and Testable Design (Hardcover)
Keynote address tribute to Professor Mel Breuer: TaylorCharles E. This Print-on-Demand format will be printed specifically to fill your order. Testability-based partial scan analysis. On Ane Design for Testability Techniques. If this is a republication request please include details of the new work in which the Wiley content will appear. MenonDavid T. Separate different tags with a comma. Miron AbramoviciPrashant S. In-system silicon validation using a reconfigurable platform.
Dynamic testzble identification in automatic test generation. BreuerArthur D. A maximal resolution guided-probe testing algorithm. Not open to the public Miron AbramoviciKrishna B. Miron AbramoviciAl Crouch: Built-in self-test of FPGA interconnect. CheathamAndrew M. Then set up a personal list of libraries from your profile page by clicking on your user name at the top right of any screen.
Series Electrical engineering, communications, and signal processing Electrical engineering communications and signal processing series Subjects Digital integrated circuits — Testing.